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Cited 15 time in webofscience Cited 14 time in scopus
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Curved copper nanowires-based robust flexible transparent electrodes via all-solution approach

Authors
Yin, ZhenxingSong, Seung KeunCho, SanghunYou, Duck-JaeYoo, JeeyoungChang, Suk TaiKim, Youn Sang
Issue Date
Sep-2017
Publisher
TSINGHUA UNIV PRESS
Keywords
curved Cu nanowires; all-solution processes; 20 mu m patterns; high performance; transparent electrode
Citation
NANO RESEARCH, v.10, no.9, pp 3077 - 3091
Pages
15
Journal Title
NANO RESEARCH
Volume
10
Number
9
Start Page
3077
End Page
3091
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/3971
DOI
10.1007/s12274-017-1523-5
ISSN
1998-0124
1998-0000
Abstract
Curved Cu nanowire (CCN)-based high-performance flexible transparent conductive electrodes (FTCEs) were fabricated via a fully solution-processed approach, involving synthesis, coating, patterning, welding, and transfer. Each step involved an innovative technique for completing the all-solution processes. The high-quality and well-dispersed CCNs were synthesized using a multi-polyol method through the synergistic effect of specific polyol reduction. To precisely control the optoelectrical properties of the FTCEs, the CCNs were uniformly coated on a polyimide (PI) substrate via a simple meniscus-dragging deposition method by tuning several coating parameters. We also employed a polyurethane (PU)-stamped patterning method to effectively produce 20 mu m patterns on CCN thin films. The CCN thin films exhibited high electrical performance, which is attributed to the deeply percolated CCN network formed via a solvent-dipped welding method. Finally, the CCN thin films on the PI substrate were partially embedded and transferred to the PU matrix to reduce their surface roughness. Through consecutive processes involving the proposed methods, a highly percolated CCN thin film on the PU matrix exhibited high optoelectrical performance (R-s = 53.48 Omega/square at T = 85.71%), excellent mechanical properties (R/R-0 < 1.10 after the 10th repetition of tape peeling or 1,000 bending cycles), and a low root-mean-square surface roughness (R-rms = 14.36 nm).
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공과대학 (화학공학과)
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