한국어
LIBRARY
Communities & Collections
Researchers
Titles
Issue Date
Journals
검색
Search
All of ScholarWorks
College of ICT Engineering
School of Electrical and Electronics Engineering
1. Journal Articles
Current filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Current filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Current filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Current filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Current filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Add filters:
Title
Author
Subject
Date Issued
Type
Language
Journal
Journal Index
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort items by
Relevance
Title
Issue Date
In order
Ascending
Descending
Authors/record
All
1
5
10
15
20
25
30
35
40
45
50
Results 1-1 of 1 (Search time: 0.006 seconds).
Secondary ion mass spectrometry (SIMS) characteristics of various FSG capping layers
Lee, D.-W.; Kim, N.-H.; Kim, S.-Y.; Chang, E.-G.
Article
Issue Date
2004
Citation
Proceedings - Electrochemical Society, v.11, pp 171 - 195
1
Discover
Author
Chang, E.-G.
1
Kim, N.-H.
1
Kim, S.-Y.
1
Unknown
1
Subject
Contamination
1
Fourier transform infrared spectr...
1
Glass
1
High density plasmas
1
Metal analysis
1
Metal contamination
1
Secondary ion mass spectrometry
1
Silicates
1
Type
Article
1
BROWSE
한국어
Communities & Collections
Researchers
Titles
Journals
LIBRARY