The effect of Eu substitution on the ferroelectric properties of Bi4Ti3O12 thin films prepared by metal-organic decomposition
DC Field | Value | Language |
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dc.contributor.author | Kim, KT | - |
dc.contributor.author | Kim, CI | - |
dc.contributor.author | Kang, DH | - |
dc.contributor.author | Shim, IW | - |
dc.date.accessioned | 2021-06-18T13:44:24Z | - |
dc.date.available | 2021-06-18T13:44:24Z | - |
dc.date.issued | 2002-12 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.issn | 1879-2731 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/47188 | - |
dc.description.abstract | The effect of europium substitution on the ferroelectric properties of Bi4Ti3O12 thin films has been investigated. Ferroelectric europium-substituted Bi4Ti3O12 thin films were fabricated by spin-coating onto a Pt/Ti/SiO2/Si substrate. The structure and morphology of the films were analyzed using X-ray diffraction and scanning electron microscopy, respectively. After annealing at 750 degreesC, Bi3.25Eu0.75Ti3O12 (BET) films become crystallized and exhibit a polycrystalline structure. The BET thin films showed a large remanent polarization (2P(r)) of 60.99 muC/cm(2) at an applied voltage of 10 V. The BET thin films exhibited no significant degradation of switching charge for at least up to 5 X 10(9) switching cycles at a frequency of 50 kHz. (C) 2002 Elsevier Science B.V All rights reserved. | - |
dc.format.extent | 5 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | The effect of Eu substitution on the ferroelectric properties of Bi4Ti3O12 thin films prepared by metal-organic decomposition | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/S0040-6090(02)00981-1 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.422, no.1-2, pp 230 - 234 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000179903800039 | - |
dc.identifier.scopusid | 2-s2.0-0037147119 | - |
dc.citation.endPage | 234 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 230 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 422 | - |
dc.type.docType | Article | - |
dc.publisher.location | 스위스 | - |
dc.subject.keywordAuthor | ferroelectric properties | - |
dc.subject.keywordAuthor | dielectric properties | - |
dc.subject.keywordAuthor | metal-organic decomposition (MOD) | - |
dc.subject.keywordAuthor | electrical properties and measurements | - |
dc.subject.keywordPlus | BISMUTH TITANATE | - |
dc.subject.keywordPlus | MEMORIES | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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