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Numerical solution of higher order mode cutoff frequencies in asymmetric TEM cells by Galerkin method

Authors
Yun, JHLee, HJKim, JK
Issue Date
Nov-1999
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
cutoff frequency; EMC; Galerkin method; TEM cell
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.41, no.4, pp 273 - 279
Pages
7
Journal Title
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume
41
Number
4
Start Page
273
End Page
279
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/47415
DOI
10.1109/15.809790
ISSN
0018-9375
Abstract
The authors describe a Galerkin method (GM), which determines efficiently the basis functions satisfying the edge conditions and the size of the elements on the Neumann boundaries in this paper. The calculated higher order mode cutoff frequencies in both symmetric and asymmetric TEM cells by the GM are presented. The authors could then solve the technical debate for TE12-, TE03-, TM11-, and TM12-mode cutoff frequencies in the symmetric TEM cell. It is also shown that the measured resonant frequencies of a designed asymmetric TEM cell agree well with the predicted data by the GM.
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