열악한 환경에서 작동가능 가스센서 응용을 위한 4H-실리콘 카바이드 오믹접촉에 관한 전기적인 특성 연구
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 이상권 | - |
dc.date.accessioned | 2021-10-27T02:40:15Z | - |
dc.date.available | 2021-10-27T02:40:15Z | - |
dc.date.issued | 2004 | - |
dc.identifier.issn | 0374-4914 | - |
dc.identifier.issn | 2289-0041 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/50782 | - |
dc.description.abstract | We have investigated the electrical characteristics of three dierent stacks of ohmic contacts(TiW/Ti/Pt, TiW, and Ni/TaSix/Pt) on highly doped n-type 4H-silicon carbide for harsh environmentoperation gas sensor applications such as automotive and space aircraft applications. The rsttwo samples were tested at 500 600 C in a vacuum chamber for up to 300 hours. From our TLMmeasurement, TiW contacts with a Ti glue layer and a Pt capping layer have stable specic contactresistance at high temperature in a vacuum chamber. The long-term reliability tests of ohmiccontacts in an oxidizing environment (20 % O2/N2) for up to 520 hours showed that TiW/Ti/Pthad the better stability and the lower contact resistance while Ni/TaSix/Pt ohmic contacts had asevere contact degradation due to the oxidation at the interface. Therefore, we believe that ourTiW based metallization schemes can be applied to gas sensor operating in a harsh environmentsuch as an oxidizing ambient. | - |
dc.format.extent | 6 | - |
dc.publisher | 한국물리학회 | - |
dc.title | 열악한 환경에서 작동가능 가스센서 응용을 위한 4H-실리콘 카바이드 오믹접촉에 관한 전기적인 특성 연구 | - |
dc.title.alternative | Electrical characterization of ohmic contacts to 4H-silicon carbide for harsh environment operation gas sensor applications | - |
dc.type | Article | - |
dc.identifier.bibliographicCitation | 새물리, v.48, no.3, pp 254 - 259 | - |
dc.identifier.kciid | ART000934219 | - |
dc.description.isOpenAccess | N | - |
dc.citation.endPage | 259 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 254 | - |
dc.citation.title | 새물리 | - |
dc.citation.volume | 48 | - |
dc.publisher.location | 대한민국 | - |
dc.subject.keywordAuthor | Silicon carbide | - |
dc.subject.keywordAuthor | Ohmic contacts | - |
dc.subject.keywordAuthor | TLM structure | - |
dc.subject.keywordAuthor | 4H-SiC | - |
dc.subject.keywordAuthor | Long-term stability | - |
dc.subject.keywordAuthor | Silicon carbide | - |
dc.subject.keywordAuthor | Ohmic contacts | - |
dc.subject.keywordAuthor | TLM structure | - |
dc.subject.keywordAuthor | 4H-SiC | - |
dc.subject.keywordAuthor | Long-term stability | - |
dc.description.journalRegisteredClass | kci | - |
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