High In-Plane Seebeck Coefficients of Bi-Sb-Te Alloy Thin Films with Growth Texture and Their Field-Controlled Seebeck Coefficients
DC Field | Value | Language |
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dc.contributor.author | Park, No-Won | - |
dc.contributor.author | Lee, Won-Yong | - |
dc.contributor.author | Kim, Gil-Sung | - |
dc.contributor.author | Yoon, Young-Gui | - |
dc.contributor.author | Kikkawa, Takashi | - |
dc.contributor.author | Saitoh, Eiji | - |
dc.contributor.author | Lee, Sang-Kwon | - |
dc.date.accessioned | 2021-11-26T07:40:21Z | - |
dc.date.available | 2021-11-26T07:40:21Z | - |
dc.date.issued | 2021-02-04 | - |
dc.identifier.issn | 1932-7447 | - |
dc.identifier.issn | 1932-7455 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/51905 | - |
dc.description.abstract | Bismuth antimony telluride (BixSb2-xTe3, BST) is an alloy that has widely been used over the past 5 decades for excellent p-type thermoelectric (TE) materials that operate around 300 K, for example, for electronic refrigeration and generators with other n-type TE materials, including Bi2Te3 alloy materials. However, despite significant progress in bulk materials, there has been less progress and less detailed TE information on Seebeck coefficients in the thin-film form. Here, we report reliable in-plane Seebeck coefficients of p-type Bi0.5Sb1.5Te3 (BST) films and Bi2Te3/Bi0.5Sb1.5Te3 (BT/BST) multilayer films at 300 K using a promising measurement technique with a precisely controlled temperature difference and excellent linearity. Due to the growth texture of the films, a high in-plane Seebeck coefficient of similar to 298 mu V/K was achieved in 100 nm thick BST films at 300 K, which is an increase of'similar to 224% compared to that in 200 nm thick BT/BST multilayer films. Moreover, we demonstrate field-controlled Seebeck coefficients of p-BST films by a backside gate configuration in a field-effect transistor. Our results demonstrate the importance of providing a promising measurement technique and reliable information on the in-plane Seebeck coefficients of Bi-Sb-Te alloy thin films for further TE device applications. | - |
dc.format.extent | 9 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | High In-Plane Seebeck Coefficients of Bi-Sb-Te Alloy Thin Films with Growth Texture and Their Field-Controlled Seebeck Coefficients | - |
dc.type | Article | - |
dc.identifier.doi | 10.1021/acs.jpcc.0c10926 | - |
dc.identifier.bibliographicCitation | JOURNAL OF PHYSICAL CHEMISTRY C, v.125, no.4, pp 2373 - 2381 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000618526300017 | - |
dc.identifier.scopusid | 2-s2.0-85100626604 | - |
dc.citation.endPage | 2381 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 2373 | - |
dc.citation.title | JOURNAL OF PHYSICAL CHEMISTRY C | - |
dc.citation.volume | 125 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordPlus | HIGH-THERMOELECTRIC PERFORMANCE | - |
dc.subject.keywordPlus | BISMUTH TELLURIDE | - |
dc.subject.keywordPlus | THERMAL-PROPERTIES | - |
dc.subject.keywordPlus | POWER | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | FIGURE | - |
dc.subject.keywordPlus | SUPERLATTICES | - |
dc.subject.keywordPlus | CONDUCTIVITY | - |
dc.subject.keywordPlus | OPTIMIZATION | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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