Structural and dielectric characterizations of PST(Pb0.8Sr0.2)O-3/PST(Pb0.2Sr0.8)O-3 heterolayered thin films
DC Field | Value | Language |
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dc.contributor.author | Kim, Kyoung-Tae | - |
dc.contributor.author | Kim, Chang-Il | - |
dc.contributor.author | Woo, Jong-Chang | - |
dc.contributor.author | Kim, Gwan-Ha | - |
dc.contributor.author | Lee, Sung-Gap | - |
dc.date.accessioned | 2022-01-11T04:41:00Z | - |
dc.date.available | 2022-01-11T04:41:00Z | - |
dc.date.issued | 2007-10 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.issn | 1976-8524 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/53258 | - |
dc.description.abstract | Dielectric (Pb0.8Sr0.2)O-3 (PST (80/20)) / (Pb0.2Sr0.8)O-3 (PST (20/80)) heterolayered thin-film structures were fabricated by a spin-coating method on Pt/Ti/SiO2/Si substrate by alternately using PST (20/80) and PST (80/20) alkoxide solution. The structure and the morphology of the films were analyzed by X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM). The PST heterolayered thin films exhibited strong (10 0) orientation. It can be assumed that the lower PST layer forms a nucleation site or a seeding layer for the formation of the upper PST layer. The dielectric constant, dielectric loss, and tunability of the PST-6 heterolayered structure measured at 100 kHz were 452.2, 0.021 and 41 %, respectively. All these parameters showed an increase with an increasing number of coatings, due to an increase in the strong (100) orientation. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.title | Structural and dielectric characterizations of PST(Pb0.8Sr0.2)O-3/PST(Pb0.2Sr0.8)O-3 heterolayered thin films | - |
dc.type | Article | - |
dc.identifier.doi | 10.3938/jkps.51.92 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, no.SUPPL. 2, pp S92 - S95 | - |
dc.identifier.kciid | ART001090010 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000250755900008 | - |
dc.identifier.scopusid | 2-s2.0-36348932838 | - |
dc.citation.endPage | S95 | - |
dc.citation.number | SUPPL. 2 | - |
dc.citation.startPage | S92 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 51 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.publisher.location | 대한민국 | - |
dc.subject.keywordAuthor | dielectric properties | - |
dc.subject.keywordAuthor | sol-gel | - |
dc.subject.keywordAuthor | heterolayered thin film | - |
dc.subject.keywordAuthor | PST | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
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