Removal of eye blink artifacts from EEG signals based on cross-correlation
- Authors
- Yoo, K.-S.; Basa, T.; Lee, W.-H.
- Issue Date
- Nov-2007
- Publisher
- IEEE Computer Society
- Citation
- 2007 International Conference on Convergence Information Technology, ICCIT 2007, pp 2005 - 2008
- Pages
- 4
- Journal Title
- 2007 International Conference on Convergence Information Technology, ICCIT 2007
- Start Page
- 2005
- End Page
- 2008
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/55163
- DOI
- 10.1109/ICCIT.2007.4420546
- ISSN
- 0000-0000
- Abstract
- Artifacts such as eye blinks cause interference signals within electroencephalogram (EEG) measurements. Therefore, we propose a method for artifact removal based on certain power spectrum features of independent components extracted from the EEGs by fusing ensemble average and cross-corrasion parameter. First, each independent component which was assumed to be a source was searched by applying cross-corrasion parameter to EEG which involved artifacts relevant to the eye blinks of a normal person. Next, the signal which was assumed to be blink artifacts can be removed using high-pass filtering. The removal results of the eye blink artifacts are fed into the interpretation system. © 2007 IEEE.
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Collections - Graduate School of Advanced Imaging Sciences, Multimedia and Film > Department of Imaging Science and Arts > 1. Journal Articles
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