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Ferroelectric and piezoelectric properties of lead-free BaTiO3 doped Bi0.5Na0.5TiO3 thin films from metal-organic solution deposition

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dc.contributor.authorAcharya, Susant Kumar-
dc.contributor.authorLee, Sang-Kwon-
dc.contributor.authorHyung, Jung-Hwan-
dc.contributor.authorYang, Yun-Ho-
dc.contributor.authorKim, Bok-Hee-
dc.contributor.authorAhn, Byung-Guk-
dc.date.accessioned2022-04-27T03:40:14Z-
dc.date.available2022-04-27T03:40:14Z-
dc.date.issued2012-11-
dc.identifier.issn0925-8388-
dc.identifier.issn1873-4669-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56906-
dc.description.abstractLead-free 0.94Bi(0.5)Na(0.5)TiO(3)-0.06BaTiO(3) (BNT-BT) piezoelectric thin films were prepared by metalorganic solution deposition onto a Pt/Ti/SiO2/Si substrate. A dense and well crystallized thin film with a perovskite phase was obtained by annealing these films at 700 degrees C. Atomic force microscopy showed that these films were smooth and crack-free with an average grain size on the order of 200 nm. Thin films of 356 nm thickness exhibited a small signal dielectric constant and a loss tangent at 1 kHz of 613 and 0.044, respectively. Ferroelectric hysteresis measurements indicated a remanent polarization value of 21.5 mu C/cm(2) with a coercive field of 164.5 kV/cm. The leakage current density of the thin film was 4.08 x 10(-4) A/cm(2) at an applied electric field of 200 kV/cm. A typical butterfly-shaped piezoresponse loop was observed and the effective piezoelectric coefficient (d(33)) of the BNT-BT thin film was approximately 51.6 pm/V. (C) 2012 Elsevier B.V. All rights reserved.-
dc.format.extent6-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIER SCIENCE SA-
dc.titleFerroelectric and piezoelectric properties of lead-free BaTiO3 doped Bi0.5Na0.5TiO3 thin films from metal-organic solution deposition-
dc.typeArticle-
dc.identifier.doi10.1016/j.jallcom.2012.06.071-
dc.identifier.bibliographicCitationJOURNAL OF ALLOYS AND COMPOUNDS, v.540, pp 204 - 209-
dc.description.isOpenAccessN-
dc.identifier.wosid000308068700036-
dc.citation.endPage209-
dc.citation.startPage204-
dc.citation.titleJOURNAL OF ALLOYS AND COMPOUNDS-
dc.citation.volume540-
dc.type.docTypeArticle-
dc.publisher.location스위스-
dc.subject.keywordAuthorThin films-
dc.subject.keywordAuthorPiezoelectricity-
dc.subject.keywordAuthorDielectric response-
dc.subject.keywordAuthorFerroelectrics-
dc.subject.keywordPlusSOL-GEL-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusCERAMICS-
dc.subject.keywordPlusPIEZORESPONSE-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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