Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films
- Authors
- Park, S.; Horibe, Y.; Asada, T.; Wielunski, L. S.; Lee, N.; Bonanno, P. L.; O'Malley, S. M.; Sirenko, A. A.; Kazimirov, A.; Tanimura, M.; Gustafsson, T.; Cheong, S.-W.
- Issue Date
- Feb-2008
- Publisher
- American Chemical Society
- Citation
- Nano Letters, v.8, no.2, pp 720 - 724
- Pages
- 5
- Journal Title
- Nano Letters
- Volume
- 8
- Number
- 2
- Start Page
- 720
- End Page
- 724
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/57379
- DOI
- 10.1021/nl072848s
- ISSN
- 1530-6984
1530-6992
- Abstract
- One of the central challenges of nanoscience is fabrication of nanoscale structures with well-controlled architectures using planar thin-film technology. Herein, we report that ordered nanocheckerboards in ZnMnGaO4 films were grown epitaxially on single-crystal MgO substrates by utilizing a solid-state method of the phase separation-induced self-assembly. The films consist of two types of chemically distinct and regularly spaced nanorods with mutually coherent interfaces, similar to 4 x 4 x 750 nm(3) in size and perfectly aligned along the film growth direction. Surprisingly, a significant in-plane strain, more than 2%, from the substrate is globally maintained over the entire film thickness of about 820 nm. The strain energy from Jahn-Teller distortions and the film-substrate lattice mismatch induce the,coherent three-dimensional (3D) self-assembled nanostructure, relieving the volume strain energy while suppressing the formation of dislocations.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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