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Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffractionopen access
- Authors
- O'Malley, S. M.; Bonanno, P. L.; Ahn, K. H.; Sirenko, A. A.; Kazimirov, A.; Tanimura, M.; Asada, T.; Park, S.; Horibe, Y.; Cheong, S-W.
- Issue Date
- Oct-2008
- Publisher
- AMER PHYSICAL SOC
- Citation
- PHYSICAL REVIEW B, v.78, no.16
- Journal Title
- PHYSICAL REVIEW B
- Volume
- 78
- Number
- 16
- ISSN
- 2469-9950
2469-9969
- Abstract
- The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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