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Temperature Dependence of Threshold Current of Transverse Single-Mode InGaAsP/InGaP Buried-Heterostructure Laser

Authors
Yoo, Jae SooKo, YongtaeKim, HansaengPak, GeorguiLim, GabgyuKim, Taeil
Issue Date
May-1994
Publisher
IOP Publishing Ltd
Keywords
CHARACTERISTIC TEMPERATURE; HETEROJUNCTION; CARRIER LOSS; INGAASP INGAP LASER; AUGER RECOMBINATION
Citation
Japanese Journal of Applied Physics, v.33, no.5A, pp 2559 - 2562
Pages
4
Journal Title
Japanese Journal of Applied Physics
Volume
33
Number
5A
Start Page
2559
End Page
2562
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/57537
DOI
10.1143/JJAP.33.2559
ISSN
0021-4922
1347-4065
Abstract
Separate-confinement-heterostructure single-quantum-well (SCH-SQW) InGaAsP/InGaP structures were grown on a (100) GaAs substrate by liquid-phase epitaxy (LPE) and then buried-heterostructure (BH) lasers were fabricated after mesa etching. The output power of laser diodes could be cw-operated near 50 mW without any kink in the transverse single mode. The measured values of a charateristic temperature T0 for BH InGaAsP/InGaP lasers were around 100 K for approximately 500 mum cavity length. This relatively low value compared to the AlGaAs/GaAs quantum-well lasers could be better explained in terms of carrier leakage over the heterojunction barrier rather than Auger recombination which is intrinsic to quaternary semiconductor materials.
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