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Theoretical studies of plasma ion implantation

Authors
Lee, Jae KooHahn, Sang June
Issue Date
Jun-1991
Publisher
Publ by IEEE, Piscataway, NJ, United States
Citation
1991 IEEE International Conference on Plasma Science, pp 119 - 119
Pages
1
Journal Title
1991 IEEE International Conference on Plasma Science
Start Page
119
End Page
119
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/59353
Abstract
Plasma ion implantation is studied using a kinetic PIC (particle-in-cell) simulation method for a bounded plasma system, allowing an external circuit as in laboratory experiments. It predicts the kinetic properties which are inaccessible with the fluid approach. The applied voltage magnitude and frequency depend on the application area, tool hardening, or electronic material processing. By using a rather modest computing facility (PC-80386 or VAX-8800), the average and peak currents are calculated together with the sheath size and the implanted ion energy distribution. These results compare well with other analytic and fluid calculations.
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Hahn, Sang June
자연과학대학 (물리학과)
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