Depth measurement using frequency analysis with an active projection

Abstract

The authors propose a new method to extract the depth information from two-dimensional (2D) image. We project a sinusoidal pattern to the object and compute the pattern's frequency varied with the shape of the object. The extracted frequency enables us to measure the depth information of it. The best advantage of the proposed method is to use the only one active projected image. We expect that the proposed algorithm can be applied to vision system, virtual environment etc. In experiment, this proposed algorithm showed a mean error of about 2.44 percents in measuring depth compared with the ground truth.