Effects of Mg Suppressor Layer on the InZnSnO Thin-Film Transistors
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Chang-Woo | - |
dc.contributor.author | Kim, Kyung-Hyun | - |
dc.contributor.author | Yang, Ji-Woong | - |
dc.contributor.author | Kim, Dae-Hwan | - |
dc.contributor.author | Choi, Yong-Jin | - |
dc.contributor.author | Hong, Chan-Hwa | - |
dc.contributor.author | Shin, Jae-Heon | - |
dc.contributor.author | Kwon, Hyuck-In | - |
dc.contributor.author | Song, Sang-Hun | - |
dc.contributor.author | Cheong, Woo-Seok | - |
dc.date.available | 2019-03-08T13:36:36Z | - |
dc.date.issued | 2016-04 | - |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.issn | 2233-4866 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/7118 | - |
dc.description.abstract | We investigate the effects of magnesium (Mg) suppressor layer on the electrical performances and stabilities of amorphous indium-zinc-tin-oxide (a-ITZO) thin-film transistors (TFTs). Compared to the ITZO TFT without a Mg suppressor layer, the ITZO: Mg TFT exhibits slightly smaller field-effect mobility and much reduced subthreshold slope. The ITZO: Mg TFT shows improved electrical stabilities compared to the ITZO TFT under both positive-bias and negative-bias-illumination stresses. From the Xray photoelectron spectroscopy O1s spectra with fitted curves for ITZO and ITZO: Mg films, we observe that Mg doping contributes to an enhancement of the oxygen bond without oxygen vacancy and a reduction of the oxygen bonds with oxygen vacancies. This result shows that the Mg can be an effective suppressor in a-ITZO TFTs. | - |
dc.format.extent | 6 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IEEK PUBLICATION CENTER | - |
dc.title | Effects of Mg Suppressor Layer on the InZnSnO Thin-Film Transistors | - |
dc.type | Article | - |
dc.identifier.doi | 10.5573/JSTS.2016.16.2.198 | - |
dc.identifier.bibliographicCitation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.16, no.2, pp 198 - 203 | - |
dc.identifier.kciid | ART002100870 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000375763900010 | - |
dc.identifier.scopusid | 2-s2.0-84964880247 | - |
dc.citation.endPage | 203 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 198 | - |
dc.citation.title | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.volume | 16 | - |
dc.type.docType | Article | - |
dc.publisher.location | 대한민국 | - |
dc.subject.keywordAuthor | Mg suppression layer | - |
dc.subject.keywordAuthor | a-ITZO TFT | - |
dc.subject.keywordAuthor | electrical performances and stabilities | - |
dc.subject.keywordAuthor | oxygen vacancy | - |
dc.subject.keywordPlus | SEMICONDUCTOR | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
84, Heukseok-ro, Dongjak-gu, Seoul, Republic of Korea (06974)02-820-6194
COPYRIGHT 2019 Chung-Ang University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.