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Electrical Transport Characteristics of PEDOT:PSS/n-Si Schottky Junction Diodes and Electrical Degradation in Hybrid Solar Cells

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dc.contributor.authorHyung, Jung-Hwan-
dc.contributor.authorKim, Gil-Sung-
dc.contributor.authorJeong, Jin-Tak-
dc.contributor.authorChoi, In-Hwan-
dc.contributor.authorHong, Chang-Hee-
dc.contributor.authorYun, Seoungjin-
dc.contributor.authorKoh, Jung-Hyuk-
dc.contributor.authorLee, Sang-Kwon-
dc.date.available2019-03-08T17:41:25Z-
dc.date.issued2015-04-
dc.identifier.issn1555-130X-
dc.identifier.issn1555-1318-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/9736-
dc.description.abstractWe have recently reported on the electrical transport characteristics of PEDOT:PSS/n-Si Schottky junction diodes, which demonstrated excellent rectifying behavior. In this study, we investigated in further detail the electrical transport properties of Schottky diodes and the electrical degradation in PEDOT:PSS-based solar cells. To examine the electrical properties, Schottky barrier heights, and ideality factors of Au/PEDOT:PSS/n-Si Schottky diodes, both current-voltage and capacitance-voltage measurements were conducted. In addition, we fabricated hybrid PEDOT:PSS/n-Si solar cells to compare the electrical degradation of the devices with and without polymethylmethacrylate (PMMA) layers. Our experimental results suggest that the presence of a PMMA layer in a PEDOT:PSS/n-Si solar cell significantly reduces the electrical degradation resulting from air exposures of up to 10 days.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.titleElectrical Transport Characteristics of PEDOT:PSS/n-Si Schottky Junction Diodes and Electrical Degradation in Hybrid Solar Cells-
dc.typeArticle-
dc.identifier.doi10.1166/jno.2015.1736-
dc.identifier.bibliographicCitationJOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, v.10, no.2, pp 229 - 233-
dc.description.isOpenAccessN-
dc.identifier.wosid000357170600013-
dc.identifier.scopusid2-s2.0-84931077104-
dc.citation.endPage233-
dc.citation.number2-
dc.citation.startPage229-
dc.citation.titleJOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS-
dc.citation.volume10-
dc.type.docTypeArticle-
dc.publisher.location미국-
dc.subject.keywordAuthorPEDOT:PSS-
dc.subject.keywordAuthorSchottky Junction Diode-
dc.subject.keywordAuthorElectrical Degradation-
dc.subject.keywordAuthorCurrent-Voltage Measurement-
dc.subject.keywordAuthorPower Conversion Efficiency-
dc.subject.keywordPlusSILICON-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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