Yoon, Jeong-Kee; Kim, Dae-Hyun; Kang, Mi-Lan; Jang, Hyeon-Ki; Park, Hyun-Ji; Lee, Jung Bok; Yi, Se Won; Kim, Hye-Seon; Baek, Sewoom; Park, Dan Bi, et al.
ArticleIssue Date2020CitationSMALL, v.16, no.16PublisherWILEY-V C H VERLAG GMBH
Jeon, Woongsun; Georgiou, Anastasis; Sun, Zongxuan; Rothamer, David A.; Kim, Kenneth; Kweon, Chol-Bum; Rajamani, Rajesh
ArticleIssue Date2023CitationIEEE Transactions on Instrumentation and Measurement, v.72, pp 1 - 1PublisherInstitute of Electrical and Electronics Engineers Inc.