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Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress Go to Link

Bae, Jongsun; Baeg, Sanghyeon; Park, Sungju

ArticleIssue Date2012CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.61, no.12, pp 3259 - 3272PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCOPUS

Soft error issues with scaling technologies Go to Link

Baeg, Sanghyeon; Bae, Jongsun; Lee, Soonyoung; Lim, Chul seung; Jeon, Sang hoon; Nam, Hyeonwoo

ArticleIssue Date2012CitationProceedings of the Asian Test Symposium, pp 68 - 68PublisherIEEE

SCOPUS

SRAM cell reliability degradations due to cell crosstalk Go to Link

Bae, Jongsun; Baeg, Sanghyeon; Wen, Shijie; Wong, Rick

ArticleIssue Date2010CitationIEEE International Integrated Reliability Workshop Final Report, pp 129 - 132PublisherIEEE

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Browsing by Bae, JongsunAuthor

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