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Soft error issues with scaling technologies
- Authors
- Baeg, Sanghyeon; Bae, Jongsun; Lee, Soonyoung; Lim, Chul seung; Jeon, Sang hoon; Nam, Hyeonwoo
- Issue Date
- Nov-2012
- Publisher
- IEEE
- Keywords
- Multiple cell upset (MCU); Single-event upset (SEU); Soft error
- Citation
- Proceedings of the Asian Test Symposium, pp 68 - 68
- Pages
- 1
- Indexed
- SCOPUS
- Journal Title
- Proceedings of the Asian Test Symposium
- Start Page
- 68
- End Page
- 68
- ISSN
- 1081-7735
2377-5386
- Abstract
- As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated. In an 28-nm design example, SEU can happen in 6-day interval if no mitigation technique is used. © 2012 IEEE.
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)