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A single event upset tolerant latch designGo to Link

Wang, Haibin; Dai, Xixi; Wang, Yangsheng; Nofal, Issam; Cai, Li; Shen, Zicai; Sun, Wanxiu; Bi, Jinshun; Li, Bo; Guo, Gang, et al.

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.88-90, pp 909 - 913PublisherPERGAMON-ELSEVIER SCIENCE LTD
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