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SCISCIESCOPUS
A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error ResilienceGo to Link

Li, Y. -Q.; Wang, H. -B.; Liu, R.; Chen, L.; Nofal, I.; Shi, S. -T.; He, A. -L; Guo, G.; Baeg, S. H.; Wen, S. -J., et al.

ArticleIssue Date2017CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.6, pp 1554 - 1561PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
BPPT - Bulk potential protection technique for hardened sequentialsGo to Link

Nofal, I; Evans, A.; He, A.-L.; Guo, G.; Li, Yuanqing; Chen, L.; Liu, R.; Wang, H.-B.; Chen, M.; Baeg, S.H., et al.

ArticleIssue Date2017Citation2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, pp 28 - 32PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Erratum to: Guidelines for the use and interpretation of assays for monitoring autophagy (3rd edition)Go to Link

Klionsky, D.J.; Abdelmohsen, K.; Abe, A.; Abedin, M.J.; Abeliovich, H.; Arozena, A.A.; Adachi, H.; Adams, C.M.; Adams, P.D.; Adeli, K., et al.

ArticleIssue Date2016CitationAutophagy, v.12, no.2, pp 443 - 443PublisherTaylor and Francis Inc.
SCISCIESCOPUS
Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS TechnologyGo to Link

Wang, H. -B.; Mahatme, N.; Chen, L.; Newton, M.; Li, Y. -Q.; Liu, R.; Chen, M.; Bhuva, B. L.; Lilja, K.; Wen, S. -J., et al.

ArticleIssue Date2016CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.1, pp 385 - 391PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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