Jung, Hyung-Suk; Yu, Il-Hyuk; Kim, Hyo Kyeom; Lee, Sang Young; Lee, Joohwi; Choi, Yujin; Chung, Yoon Jang; Lee, Nae-In; Park, Tae Joo; Choi, Jung-Hae, et al.
ArticleIssue Date2012CitationIEEE Transactions on Electron Devices, v.59, no.9, pp.2350 - 2356PublisherInstitute of Electrical and Electronics Engineers