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A study on degradation mechanism of flexible a-InGaZnO thin film transistor under repetitive bending stress using simulation

Han, Ki lim; Jeong, Hyun Jun; Kim, Beom su; Oh, Saeroonter; Park, Jin seong

ArticleIssue Date2018CitationProceedings of the International Display Workshops, IDW 2018, v.1, pp 330 - 333PublisherInternational Display Workshops
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