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SCISCIESCOPUS
A High-Reliability Carry-Free Gate Driver for Flexible Displays Using a-IGZO TFTsGo to Link

Kim, Jong-Seok; Byun, Jung-Woo; Jang, Jun-Hwan; Kim, Yong-Duck; Han, Ki-Lim; Park, Jin-Seong; Choi, Byong-Deok

ArticleIssue Date2018CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp 3269 - 3276PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUSKCI
Comparative Study on Hydrogen Behavior in InGaZnO Thin Film Transistors with a SiO2/SiNx/SiO2 Buffer on Polyimide and Glass SubstratesGo to Link

Han, Ki-Lim; Cho, Hyeon-Su; Ok, Kyung-Chul; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2018CitationELECTRONIC MATERIALS LETTERS, v.14, no.6, pp.749 - 754PublisherKOREAN INST METALS MATERIALS
SCIESCOPUS
Effect of hydrogen on the device performance and stability characteristics of amorphous InGaZnO thin-film transistors with a SiO2/SiNx/SiO2 bufferGo to Link

Han, Ki-Lim; Ok, Kyung-Chul; Cho, Hyeon-Su; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2017CitationAPPLIED PHYSICS LETTERS, v.111, no.6, pp.1 - 5PublisherAMER INST PHYSICS
SCOPUSKCI
Effect of mechanical stress on the stability of flexible InGaZnO thin-film transistorsGo to Link

Jeong, Hyun-Jun; Han, Ki-Lim; Ok, Kyung-Chul; Lee, Hyun-Mo; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2017CitationJOURNAL OF INFORMATION DISPLAY, v.18, no.2, pp.87 - 91PublisherTAYLOR & FRANCIS LTD
SCIESCOPUS
Effects of Repetitive Mechanical Stress on Flexible Oxide Thin-Film Transistors and Stress Reduction via Additional Organic LayerGo to Link

Jeong, Hyun-Jun; Han, Ki-Lim; Jeong, Kyung-Sub; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2018CitationIEEE ELECTRON DEVICE LETTERS, v.39, no.7, pp.971 - 974PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Electrical Stability Analysis of Dynamic Logic Using Amorphous Indium-Gallium-Zinc-Oxide TFTsGo to Link

Kim, Yong-Duck; 김종석; Lee, Jong-Il; Han, Ki-Lim; Kim, Beom-Su; PARK, JIN SEONG; CHOI, BYONG DEOK

ArticleIssue Date2019CitationIEEE ELECTRON DEVICE LETTERS, v.40, no.7, pp 1128 - 1131PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Organic/Inorganic Hybrid Buffer in InGaZnO Transistors under Repetitive Bending Stress for High Electrical and Mechanical StabilityGo to Link

Han, Ki-Lim; Han, Ju-Hwan; Kim, Beom-Su; Jeong, Hyun-Jun; Choi, Jin-Myung; Hwang, Ji-Eun; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2020CitationACS APPLIED MATERIALS & INTERFACES, v.12, no.3, pp 3784 - 3791PublisherAMER CHEMICAL SOC
SCIESCOPUS
Quantitative analysis of interface trap recovery caused by repetitive bending stress in flexible oxide thin-film transistorsGo to Link

Jeong, Hyun-Jun; Kim, Beom-Su; Han, Ki-Lim; Oh, Saeroonter; Park, Jin-Seong

ArticleIssue Date2019CitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.58, no.5, pp.1 - 4PublisherIOP PUBLISHING LTD
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