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Showing results 1 to 2 of 2
SCIE
SCOPUS
Si wafer surface cleaning using laser-induced shock wave: a new dry cleaning methodology
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Lee, SH;
Park, JG
; Lee, JM; Cho, SH; Cho, HK
Article
Issue Date
2003
Citation
Surface and Coatings Technology, v.169-170, pp.178 - 180
Publisher
Elsevier BV
SCIE
SCOPUS
Vibration analysis of a nearly axisymmetric shell structure using a new finite ring element
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Chung, Jintai
; Lee, JM
Article
Issue Date
1999
Citation
JOURNAL OF SOUND AND VIBRATION, v.219, no.1, pp.35 - 50
Publisher
ACADEMIC PRESS LTD
1
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