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Browsing by Lee, KiseokAuthor

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Experimental Exploitation of Random and Deterministic Data Patterns for Stringent DDR4 I/O Timing Margins Go to Link

ArticleIssue Date2019CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.4, pp 388 - 395PublisherIEEK PUBLICATION CENTER

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Fault Coverage Re-Evaluation of Memory Test Algorithms with Physical Memory Characteristics Go to Link open access

Lee, Kiseok; Kim, Jeonghwan; Baeg, Sanghyeon

ArticleIssue Date2021CitationIEEE Access, v.9, pp 124632 - 124639PublisherInstitute of Electrical and Electronics Engineers Inc.

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FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor Go to Link

Waqar, Muhammad; Baeg, Sanghyeon; Bak, Geunyong; Kwon, Junhyeong; Lee, Kiseok; Jeon, Sang woon

ArticleIssue Date2020CitationMicroelectronics Reliability, v.114, pp 1 - 6PublisherElsevier Ltd

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Browsing by Lee, KiseokAuthor

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