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Soft error issues with scaling technologiesGo to Link

Baeg, Sanghyeon; Bae, Jongsun; Lee, Soonyoung; Lim, Chul seung; Jeon, Sang hoon; Nam, Hyeonwoo

ArticleIssue Date2012CitationProceedings of the Asian Test Symposium, pp 68 - 68PublisherIEEE
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