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Insertion loss and polarization-dependent loss measurement improvement to enable parallel silicon photonics wafer-level testing

Kim, Daehong; De Coster, Jeroen; Van Campenhout, Joris; Ban, Yoojin; Velenis, Dimitrios; Sar, Huseyin; Kobbi, Hakim; Magdziak, Rafal; Kim, Younghyun

ArticleIssue Date2025CitationOptics and Lasers in Engineering, v.186PublisherElsevier Ltd

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Browsing by Magdziak, RafalAuthor

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