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Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain ReorderingGo to Link

Dooyoung Kim; Jinuk Kim; Muhammad Ibtesam; Umair Saeed Solangi; Sungju Park

ArticleIssue Date2020CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.20, no.4, pp 390 - 404Publisher대한전자공학회
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