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Identification of insulation defects by modified Chaotic Analysis of partial discharge under DC stress Go to Link

Seo, I.J.; Koo, J.Y.; Lee, Y.J.; Lee, B.W.; Kim, J.T.; Lee, J.H.

ArticleIssue Date2015Citation44th International Conference on Large High Voltage Electric Systems 2012, v.25, no.3PublisherIEEE

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