Van Sieleghem, Edward; Suss, Andreas; Boulenc, Pierre; Lee, Jiwon; Karve, Gauri; De Munck, Koen; Cavaco, Celso; Van Hoof, Chris
ArticleIssue Date2021CitationIEEE Electron Device Letters, v.42, no.6, pp 879 - 882PublisherInstitute of Electrical and Electronics Engineers