Van Sieleghem, Edward; Karve, Gauri; De Munck, Koen; Vinci, Andrea; Cavaco, Celso; Suss, Andreas; Van Hoof, Chris a; Lee, Jiwon
ArticleIssue Date2022CitationIEEE Transactions on Electron Devices, v.69, no.3, pp 1129 - 1136PublisherInstitute of Electrical and Electronics Engineers