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Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals Go to Link

Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.57, no.4, pp 814 - 822PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCISCIESCOPUS

Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance Go to Link

Reviriego, Pedro; Antonio Maestro, Juan; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.57, no.4, pp 2124 - 2128PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication Go to Link

Maestro, Juan Antonio; Reviriego, Pedro; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2013CitationMICROPROCESSORS AND MICROSYSTEMS, v.37, no.8, pp 1103 - 1107PublisherELSEVIER

SCIESCOPUS

SRAM Interleaving Distance Selection With a Soft Error Failure Model Go to Link

Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2009CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.56, no.4, pp 2111 - 2118PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCISCIESCOPUS

Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device Go to Link

Lee, Hosung; Baeg, Sanghyeon; Hua, Nelson; Wen, ShiJie

ArticleIssue Date2017CitationMICROELECTRONICS RELIABILITY, v.69, pp 88 - 99PublisherPERGAMON-ELSEVIER SCIENCE LTD

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Browsing by Wen, ShiJieAuthor

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