Rheem, Youngwoo; Hangarter, Carlos M.; Yang, Eui-Hyeok (EH); Park, Deok-Yong; Myung, Nosang V.; Yoo, Bongyoung
ArticleIssue Date2008CitationIEEE Transactions on Nanotechnology, v.7, no.3, pp.251 - 255PublisherInstitute of Electrical and Electronics Engineers