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Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films Go to Link

Lee, C. B.; Kang, B. S.; Lee, M. J.; Ahn, S. E.; Stefanovich, G.; Xianyu, W. X.; Kim, K. H.; Hur, J. H.; Yin, H. X.; Park, Y., et al.

ArticleIssue Date2007CitationAPPLIED PHYSICS LETTERS, v.91, no.8, pp 1 - 4PublisherAMER INST PHYSICS

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