Beyne, Eric; Kim, Soon-Wook; Peng, Lan; Heylen, Nancy; De Messemaeker, Joke; Okudur, Oguzhan Orkut; Phommahaxay, Alain; Kim, Tae-Gon; Stucchi, Michele; Velenis, Dimitrios, et al.
ArticleIssue Date2018CitationTechnical Digest - International Electron Devices Meeting, IEDM, pp.32.4.1 - 32.4.4PublisherInstitute of Electrical and Electronics Engineers Inc.