Electrochemical Potentiostatic Activation for the Improvement of 270 nm AlGaN-Based UV-C Light-Emitting Diodes
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Koh Eun | - |
dc.contributor.author | Choi, Rak Jun | - |
dc.contributor.author | Kang, Hyunwoong | - |
dc.contributor.author | Shim, Jong In | - |
dc.contributor.author | Ryu, Sang-Wan | - |
dc.contributor.author | Cho, Jaehee | - |
dc.contributor.author | Lee, June Key | - |
dc.date.accessioned | 2022-07-18T01:19:56Z | - |
dc.date.available | 2022-07-18T01:19:56Z | - |
dc.date.created | 2022-05-30 | - |
dc.date.issued | 2022-02 | - |
dc.identifier.issn | 2162-8769 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/107973 | - |
dc.description.abstract | The electrochemical potentiostatic activation (EPA) method was performed by removing hydrogen atoms from the inside of the Mg-doped p-GaN/p-AlGaN multilayer of 270 nm AlGaN-based UV-C light-emitting diodes (UV-C LEDs). The EPA evaluation was controlled among the applied voltages of 2, 3, and 4 V for 10 min under 1.0 M HCl solution, and the hole concentration inside the p-GaN/p-AlGaN multilayer was decreased. To evaluate the characteristics and reliability of UV-C LEDs, the basic flip chip process was applied and then mounted on the AlN ceramic package by AuSn eutectic bonding. Compared to the as-fabricated LED, we demonstrated an increase of over 8% in light output power at 350 mA in UV-C LEDs by improving internal quantum efficiency (IQE) with EPA treatment at 3 V. The enhanced IQE and higher EQE contributed to improving the reliability of the LEDs, thus resulting in a similar to 7% lifetime extension. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Electrochemical Society, Inc. | - |
dc.title | Electrochemical Potentiostatic Activation for the Improvement of 270 nm AlGaN-Based UV-C Light-Emitting Diodes | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Shim, Jong In | - |
dc.identifier.doi | 10.1149/2162-8777/ac53f8 | - |
dc.identifier.scopusid | 2-s2.0-85125702570 | - |
dc.identifier.wosid | 000758424200001 | - |
dc.identifier.bibliographicCitation | ECS Journal of Solid State Science and Technology, v.11, no.2, pp.1 - 6 | - |
dc.relation.isPartOf | ECS Journal of Solid State Science and Technology | - |
dc.citation.title | ECS Journal of Solid State Science and Technology | - |
dc.citation.volume | 11 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 6 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | INTERNAL QUANTUM EFFICIENCY | - |
dc.subject.keywordPlus | MG-DOPED GAN | - |
dc.subject.keywordAuthor | electrochemical potentiostatic activation | - |
dc.subject.keywordAuthor | ultraviolet | - |
dc.subject.keywordAuthor | light emitting diode | - |
dc.subject.keywordAuthor | p-GaN | - |
dc.subject.keywordAuthor | hole concentration | - |
dc.subject.keywordAuthor | internal quantum efficiency | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1149/2162-8777/ac53f8 | - |
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