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Electrochemical Potentiostatic Activation for the Improvement of 270 nm AlGaN-Based UV-C Light-Emitting Diodes

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dc.contributor.authorLee, Koh Eun-
dc.contributor.authorChoi, Rak Jun-
dc.contributor.authorKang, Hyunwoong-
dc.contributor.authorShim, Jong In-
dc.contributor.authorRyu, Sang-Wan-
dc.contributor.authorCho, Jaehee-
dc.contributor.authorLee, June Key-
dc.date.accessioned2022-07-18T01:19:56Z-
dc.date.available2022-07-18T01:19:56Z-
dc.date.created2022-05-30-
dc.date.issued2022-02-
dc.identifier.issn2162-8769-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/107973-
dc.description.abstractThe electrochemical potentiostatic activation (EPA) method was performed by removing hydrogen atoms from the inside of the Mg-doped p-GaN/p-AlGaN multilayer of 270 nm AlGaN-based UV-C light-emitting diodes (UV-C LEDs). The EPA evaluation was controlled among the applied voltages of 2, 3, and 4 V for 10 min under 1.0 M HCl solution, and the hole concentration inside the p-GaN/p-AlGaN multilayer was decreased. To evaluate the characteristics and reliability of UV-C LEDs, the basic flip chip process was applied and then mounted on the AlN ceramic package by AuSn eutectic bonding. Compared to the as-fabricated LED, we demonstrated an increase of over 8% in light output power at 350 mA in UV-C LEDs by improving internal quantum efficiency (IQE) with EPA treatment at 3 V. The enhanced IQE and higher EQE contributed to improving the reliability of the LEDs, thus resulting in a similar to 7% lifetime extension.-
dc.language영어-
dc.language.isoen-
dc.publisherElectrochemical Society, Inc.-
dc.titleElectrochemical Potentiostatic Activation for the Improvement of 270 nm AlGaN-Based UV-C Light-Emitting Diodes-
dc.typeArticle-
dc.contributor.affiliatedAuthorShim, Jong In-
dc.identifier.doi10.1149/2162-8777/ac53f8-
dc.identifier.scopusid2-s2.0-85125702570-
dc.identifier.wosid000758424200001-
dc.identifier.bibliographicCitationECS Journal of Solid State Science and Technology, v.11, no.2, pp.1 - 6-
dc.relation.isPartOfECS Journal of Solid State Science and Technology-
dc.citation.titleECS Journal of Solid State Science and Technology-
dc.citation.volume11-
dc.citation.number2-
dc.citation.startPage1-
dc.citation.endPage6-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusINTERNAL QUANTUM EFFICIENCY-
dc.subject.keywordPlusMG-DOPED GAN-
dc.subject.keywordAuthorelectrochemical potentiostatic activation-
dc.subject.keywordAuthorultraviolet-
dc.subject.keywordAuthorlight emitting diode-
dc.subject.keywordAuthorp-GaN-
dc.subject.keywordAuthorhole concentration-
dc.subject.keywordAuthorinternal quantum efficiency-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1149/2162-8777/ac53f8-
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