Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Role of weak interlayer coupling in ultrafast exciton-exciton annihilation in two-dimensional rhenium dichalcogenides

Authors
Sim, SangwanLee, DoeonLee, JekwanCha, MyungjunCha, SoonyoungHeo, WonhyeokCho, SungjunShim, WooyoungLee, KyusangYoo, JinkyoungPrasankumar, Rohit P.Choi, HyunyongJo, Moon-Ho
Issue Date
May-2020
Publisher
AMER PHYSICAL SOC
Citation
PHYSICAL REVIEW B, v.101, no.17
Indexed
SCIE
SCOPUS
Journal Title
PHYSICAL REVIEW B
Volume
101
Number
17
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/1095
DOI
10.1103/PhysRevB.101.174309
ISSN
2469-9950
Abstract
Strong interactions between excitons are a characteristic feature of two-dimensional (2D) semiconductors, determining important excitonic properties, such as exciton lifetime, coherence, and photon-emission efficiency. Rhenium disulfide (ReS2), a member of the 2D transition-metal dichalcogenide (TMD) family, has recently attracted great attention due to its unique excitons that exhibit excellent polarization selectivity and coherence features. However, an in-depth understanding of exciton-exciton interactions in ReS2 is still lacking. Here we used ultrafast pump-probe spectroscopy to study exciton-exciton interactions in monolayer (1L), bilayer (2L), and triple layer ReS2. We directly measure the rate of exciton-exciton annihilation, a representative Auger-type interaction between excitons. It decreases with increasing layer number, as observed in other 2D TMDs. However, while other TMDs exhibit a sharp weakening of exciton-exciton annihilation between 1L and 2L, such behavior was not observed in ReS2. We attribute this distinct feature in ReS2 to the relatively weak interlayer coupling, which prohibits a substantial change in the electronic structure when the thickness varies. This work not only highlights the unique excitonic properties of ReS2 but also provides novel insight into the thickness dependence of exciton-exciton interactions in 2D systems.
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Sim, Sang wan photo

Sim, Sang wan
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE