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GaN HEMT 공정의 온도 센서를 이용한 주변 온도에 따른 전류 변화량 측정
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김정현 | - |
| dc.date.accessioned | 2023-07-05T06:07:32Z | - |
| dc.date.available | 2023-07-05T06:07:32Z | - |
| dc.date.issued | 2023-02-08 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/113415 | - |
| dc.title | GaN HEMT 공정의 온도 센서를 이용한 주변 온도에 따른 전류 변화량 측정 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2023년 한국통신학회 동계종합학술발표회 | - |
| dc.citation.conferencePlace | 용평리조트 | - |
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Related Researcher
- KIM, JUNG HYUN
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)