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Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

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dc.contributor.authorTsiara,Artemisia-
dc.contributor.authorKim, Young hyun-
dc.contributor.authorYudistira,Didit-
dc.contributor.authorKunert,Bernardette-
dc.contributor.authorBaryshnikova,Marina-
dc.contributor.authorPantouvaki,Marianna-
dc.contributor.authorCampenhout,Joris Van-
dc.contributor.authorCroes,Kristof-
dc.date.accessioned2023-08-01T06:32:55Z-
dc.date.available2023-08-01T06:32:55Z-
dc.date.issued2022-09-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/113638-
dc.description.abstractWe report the reliability assessment of carrier-depletion p-n diode GaAs/Si optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vπ.Lπ with no stress temperature dependence.-
dc.format.extent3-
dc.language영어-
dc.language.isoENG-
dc.publisherOptica Publishing Group-
dc.titleImpact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.scopusid2-s2.0-85146400482-
dc.identifier.wosid000925380500039-
dc.identifier.bibliographicCitationEuropean Conference on Optical Communication (ECOC) 2022, pp 1 - 3-
dc.citation.titleEuropean Conference on Optical Communication (ECOC) 2022-
dc.citation.startPage1-
dc.citation.endPage3-
dc.type.docTypeProceeding-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.identifier.urlhttps://opg.optica.org/abstract.cfm?uri=ECEOC-2022-Mo3F.6-
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