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Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters
- Authors
- Tsiara,Artemisia; Kim, Young hyun; Yudistira,Didit; Kunert,Bernardette; Baryshnikova,Marina; Pantouvaki,Marianna; Campenhout,Joris Van; Croes,Kristof
- Issue Date
- Sep-2022
- Publisher
- Optica Publishing Group
- Citation
- European Conference on Optical Communication (ECOC) 2022, pp 1 - 3
- Pages
- 3
- Indexed
- OTHER
- Journal Title
- European Conference on Optical Communication (ECOC) 2022
- Start Page
- 1
- End Page
- 3
- ISSN
- 0000-0000
- Abstract
- We report the reliability assessment of carrier-depletion p-n diode GaAs/Si optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vπ.Lπ with no stress temperature dependence.
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Related Researcher
- Kim, Young hyun
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)