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Device-Algorithm Co-Optimization for an On-Chip Trainable Capacitor-Based Synaptic Device with IGZO TFT and Retention-Centric Tiki-Taka Algorithmopen access

Authors
Won, JongunKang, JaehyeonHong, SangjunHan, NaraeKang, MinseungPark, YeajiRoh, YoungchaeSeo, Hyeong JunJoe, ChanghoonCho, UngKang, MinilUm, MinseongLee, Kwang-HeeYang, Jee-EunJung, MoonilLee, Hyung-MinOh, SaeroonterKim, SangwookKim, Sangbum
Issue Date
Oct-2023
Publisher
Wiley-VCH Verlag
Keywords
device-algorithm co-optimization; in-memory computing; indium gallium zinc oxide thin film transistor (IGZO TFT); neuromorphic; tiki-taka algorithm
Citation
Advanced Science, v.10, no.29, pp 1 - 11
Pages
11
Indexed
SCIE
SCOPUS
Journal Title
Advanced Science
Volume
10
Number
29
Start Page
1
End Page
11
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/114391
DOI
10.1002/advs.202303018
ISSN
2198-3844
2198-3844
Abstract
Analog in-memory computing synaptic devices are widely studied for efficient implementation of deep learning. However, synaptic devices based on resistive memory have difficulties implementing on-chip training due to the lack of means to control the amount of resistance change and large device variations. To overcome these shortcomings, silicon complementary metal-oxide semiconductor (Si-CMOS) and capacitor-based charge storage synapses are proposed, but it is difficult to obtain sufficient retention time due to Si-CMOS leakage currents, resulting in a deterioration of training accuracy. Here, a novel 6T1C synaptic device using only n-type indium gaIlium zinc oxide thin film transistor (IGZO TFT) with low leakage current and a capacitor is proposed, allowing not only linear and symmetric weight update but also sufficient retention time and parallel on-chip training operations. In addition, an efficient and realistic training algorithm to compensate for any remaining device non-idealities such as drifting references and long-term retention loss is proposed, demonstrating the importance of device-algorithm co-optimization. © 2023 The Authors. Advanced Science published by Wiley-VCH GmbH.
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