Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Effects of fabrication conditions and post-annealing on the characteristics of thin film transistors with Zr-Al-Zn_O channel layers
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박진석 | - |
| dc.date.accessioned | 2021-06-22T15:10:04Z | - |
| dc.date.available | 2021-06-22T15:10:04Z | - |
| dc.date.issued | 2016-10-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/11452 | - |
| dc.title | Effects of fabrication conditions and post-annealing on the characteristics of thin film transistors with Zr-Al-Zn_O channel layers | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 6th IS-TCMs | - |
| dc.citation.conferencePlace | Crete, Greece | - |
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- PARK, JIN SEOK
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)