Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Topology-Aware Retinal Artery–Vein Classification via Deep Vascular Connectivity Predictionopen access

Authors
Shin, Seung YeonLee, SoochahnYun, Il DongLee, Kyoung Mu
Issue Date
Jan-2021
Publisher
MDPI
Keywords
Artery–vein classification; Convolutional neural network; Pairwise classification; Retinal vessel; Topology
Citation
Applied Sciences-basel, v.11, no.1, pp 1 - 14
Pages
14
Indexed
SCIE
SCOPUS
Journal Title
Applied Sciences-basel
Volume
11
Number
1
Start Page
1
End Page
14
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/115166
DOI
10.3390/app11010320
ISSN
2076-3417
Abstract
Retinal artery–vein (AV) classification is a prerequisite for quantitative analysis of retinal vessels, which provides a biomarker for neurologic, cardiac, and systemic diseases, as well as ocular diseases. Although convolutional neural networks have presented remarkable performance on AV classification, it often comes with a topological error, like an abrupt class flipping on the same vessel segment or a weakness for thin vessels due to their indistinct appearances. In this paper, we present a new method for AV classification where the underlying vessel topology is estimated to give consistent prediction along the actual vessel structure. We cast the vessel topology estimation as iterative vascular connectivity prediction, which is implemented as deep-learning-based pairwise classification. In consequence, a whole vessel graph is separated into sub-trees, and each of them is classified as an artery or vein in whole via a voting scheme. The effectiveness and efficiency of the proposed method is validated by conducting experiments on two retinal image datasets acquired using different imaging techniques called DRIVE and IOSTAR. © 2020 by the authors. Licensee MDPI, Basel, Switzerland.
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Shin, Seungyeon photo

Shin, Seungyeon
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE