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Copper-to-Copper Direct Bonding Process Using Current-Induced Enhancement Method

Authors
Kwak, ByungkwanLee, JinhyunYoon, SanghwaYoo, Bongyoung
Issue Date
May-2023
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Copper-to-copper direct bonding; Electric current; Three-dimensional integration
Citation
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), v.2023-May, pp 2120 - 2124
Pages
5
Indexed
SCI
SCOPUS
Journal Title
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC)
Volume
2023-May
Start Page
2120
End Page
2124
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/115273
DOI
10.1109/ECTC51909.2023.00364
ISSN
0569-5503
2377-5726
Abstract
In this paper, an alternative copper-to-copper direct bonding method is investigated through electric current-induced bonding, which is the enhancement method for forming copper-to-copper bonding using electric current. Electric current has two driving forces for copper-to-copper bonding: joule heat caused by electric current and electron wind force. These factors influenced the bonding formation by momentum transfer and additional diffusivity to copper atoms, so the interface of each copper pad quickly disappeared. © 2023 IEEE.
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ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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