Analysis of Copper and Copper Alloys Electric Components Short Circuited Melted Mark Metallographic Structure
- Authors
- Mo, Shanjun; Zhang, Jun; Liang, Jun; Yang, Wenbing
- Issue Date
- Jul-2012
- Publisher
- Trans Tech Publications
- Keywords
- short circuited melted mark; metallographic structure; copper alloy; electric component
- Citation
- Advanced Materials Research, v.535-537, pp 869 - 874
- Pages
- 6
- Indexed
- SCIE
SCOPUS
- Journal Title
- Advanced Materials Research
- Volume
- 535-537
- Start Page
- 869
- End Page
- 874
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/116061
- DOI
- 10.4028/www.scientific.net/AMR.535-537.869
- ISSN
- 1022-6680
1662-8985
- Abstract
- The current standard is lacking of characteristic criterion and references of various copper alloys material electric components short-circuited melted-mark metallographic structure, thus it is to the disadvantage of the development of fire investigation physical evidence identification. In the thesis, by conducting fire simulated experiments of primary short circuit and secondary short circuit with pure copper and brass alloys electric components, apply metallographic analysis methods and image processing technology to discuss and analyse the melted mark metallographic structure.
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles
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