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IoT Technology Recognition Using Deep Clustering

Authors
Kim, HyeongyunShahid, AdnanFontaine, JaronPoorter, Eli DeMoerman, IngridNam, Haewoon
Issue Date
Dec-2023
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Clustering algorithms; Deep embedding clustering; Deep learning; Feature extraction; Internet of Things; Low-power wide area networks; Semisupervised learning; technology recognition; unsupervised learning; Wireless communication; Wireless sensor networks
Citation
IEEE Internet of Things Journal, v.11, no.8, pp 1 - 12
Pages
12
Indexed
SCIE
SCOPUS
Journal Title
IEEE Internet of Things Journal
Volume
11
Number
8
Start Page
1
End Page
12
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/117858
DOI
10.1109/JIOT.2023.3338560
ISSN
2327-4662
Abstract
This paper proposes a fully unsupervised technology recognition method using deep clustering for identifying wireless technologies to learn from raw data without requiring manual label annotations. Identifying and recognizing wireless technologies is important to realize effective spectrum management. Recent scientific publications utilized supervised deep learning with great success to train AI models to recognize different wireless technologies based on labeled RF signal datasets. However, assigning labels to wireless technology signal datasets for supervised deep learning is time consuming and may not always be practical. To remedy this issue, the proposed method combines an autoencoder and clustering layers, extended with a Gaussian Mixture Model, to learn low-dimensional salient features from raw IQ data and cluster them into distinct wireless technologies. The optimal input dimensions and performance of the method in different signal-to-noise ratio conditions are analyzed for a set of several different low-power wide area network (LPWAN) technologies: Sigfox, LoRa, IEEE 802.11ah, and IEEE 802.15.4g. Extensive simulations show that the proposed method for wireless technology recognition exhibits a recognition accuracy exceeding 90%, surpassing the performance of the state-of-the-art deep clustering algorithms by 4 to 5% in terms of accuracy. IEEE
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ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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