An Improved NRW Method for Thin Material Characterization Using Dielectric Filled Waveguide and Numerical Compensation
- Authors
- Chen, Haidong; Zhang, Jun; Wang, Yi; Che, Wenquan; Huang, Zhengsheng; Qiao, Yuanjian; Luo, Junrong; Xue, Quan
- Issue Date
- Nov-2022
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- Flexible material; Nicholson-Ross-Weir method (NRW); Permittivity; Waveguide
- Citation
- IEEE Transactions on Instrumentation and Measurement, v.71, pp 1 - 9
- Pages
- 9
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE Transactions on Instrumentation and Measurement
- Volume
- 71
- Start Page
- 1
- End Page
- 9
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/117978
- DOI
- 10.1109/TIM.2021.3129205
- ISSN
- 0018-9456
1557-9662
- Abstract
- In this article, permittivity measurements based on the Nicholson-Ross-Weir (NRW) technique are reviewed, and an improved method is proposed based on dielectric-filled waveguides and numerical compensation for the electromagnetic performance measurement of the flexible materials or extremely thin materials. The dielectric-filled waveguide used in this work fixes the sample under test without any deformation during the measurement. To improve the measurement accuracy, a modified algorithm is proposed for the inversion of dielectric material and the compensation of measured results. The proposed method is verified by measuring several commercially available materials in the X-band with high accuracy and then used for the characterization of two paper-based composite electromagnetic parameters. © 1963-2012 IEEE.
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