병렬테스트 정확도 개선 위한 AWG/Digitizer 설계기술

Abstract

Parallel testing with high accuracy is challengeable. In particular, the source and capture of analog test signal is more difficult to provide parallel test accuracy, due to diverse mismatches and variations by imperfect process-voltage-temperature (PVT) variations. This work proposes an efficient design method for an arbitrary-waveform-generator (AWG) and a digitizer with ability of self-calibration process. Those test equipment exhibit the state of the art design-specifications of 64-channels and 16-bit resolutions. For the performance enhancement of those equipment, diverse calibration schemes are accomplished based on variable capacitors, offset voltage adjustment, and more. The experimental results show static and dynamic nonlinearity performances of an analog-digital converter as the key circuit of a digitizer.