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시스템 레벨에서의 DDR4의 컴포넌트 취약성 비교를 통한 Row Hammer 고찰
- Authors
- 백상현
- Issue Date
- 31-Aug-2020
- Conference Name
- 2020 Korea Test Conference
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)